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Keithley Parametryczny system do pomiaru charakterystyk - PCT (Parametric Curve Tracer)

Keithley Parametryczny system do pomiaru charakterystyk - PCT (Parametric Curve Tracer), foto 1
Keithley Parametryczny system do pomiaru charakterystyk - PCT (Parametric Curve Tracer)
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Keithley Parametryczny system do pomiaru charakterystyk - PCT (Parametric Curve Tracer) - opis

  • Complete solutions engineered for optimum price and performance
  • Field upgradable and reconfigurable ? convert your PCT to a reliability or wafer sort tester
  • Configurable power levels:From 200V to 3kV  
    From 1A to 100A
  • Wide dynamic range:
    From µV to 3kV
    From fA to 100A
  • Full range of capacitance-voltage (C-V) capability:
    fF to µF
  • Supports 2-, 3-, and 4-terminal devices
  • Up to 3kV DC bias
  • High performance test fixture supports a range of package types
  • Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others